Mutation Testing Author

Name: Benoit Baudry
Affiliation: IRISA
Email: bbaudry@irisa.fr
Webpage: http://www.irisa.fr/triskell/perso_pro/bbaudry/
1Val{\'{e}}ria Lelli and Arnaud Blouin and Benoit Baudry
Classifying and Qualifying {GUI} Defects
CoRR, abs/1703.09567(), 2017.
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2Vincent Aranega and Jean{-}Marie Mottu and Anne Etien and Thomas Degueule and Benoit Baudry and Jean{-}Luc Dekeyser
Towards an automation of the mutation analysis dedicated to model transformation
Softw. Test., Verif. Reliab., 25(), 2015.
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3Benoit Baudry and Simon Allier and Martin Monperrus
Tailored source code transformations to synthesize computationally diverse program variants
International Symposium on Software Testing and Analysis, {ISSTA} '14, San Jose, CA, {USA} - July 21 - 26, 2014, 2014.
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4Alexandre Bartel and Benoit Baudry and Freddy Munoz and Jacques Klein and Tejeddine Mouelhi and Yves Le Traon
Model Driven Mutation Applied to Adaptative Systems Testing
Fourth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2011 Workshops Proceedings, March 21 - March 25, 2011, Berlin, Germany, 2011.
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5Tejeddine Mouelhi and Yves Le Traon and Benoit Baudry
Transforming and Selecting Functional Test Cases for Security Policy Testing
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, 2009.
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6Tejeddine Mouelhi and Benoit Baudry and Yves Le Traon
Transforming and Selecting Functional Test Cases for Security Policy Testing
Proceedings of the 2nd International Conference on Software Testing, Verification and ValidationDenver, Colorado, 1-4 April 2009.
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7Romain Delamare and Benoit Baudry and Yves Le Traon
AjMutator: A Tool For The Mutation Analysis Of AspectJ Pointcut Descriptors
Proceedings of the 4th International Workshop on Mutation Analysis (MUTATION'09)Denver, Colorado, 1-4 April 2009.
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8Romain Delamare and Benoit Baudry and Sudipto Ghosh and Yves Le Traon
A Test-Driven Approach to Developing Pointcut Descriptors in AspectJ
Proceedings of the 2nd International Conference on Software Testing Verification and Validation (ICST'09)Davor Colorado, 01-04 April 2009.
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9Romain Delamare and Benoit Baudry and Sudipto Ghosh and Yves Le Traon
A Test-Driven Approach to Developing Pointcut Descriptors in AspectJ
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, 2009.
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10Romain Delamare and Benoit Baudry and Yves Le Traon
AjMutator: {A} Tool for the Mutation Analysis of AspectJ Pointcut Descriptors
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings, 2009.
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11Tejeddine Mouelhi and Franck Fleurey and Benoit Baudry
A Generic Metamodel For Security Policies Mutation
Proceedings of the IEEE International Conference on Software Testing Verification and Validation Workshop (ICSTW'08)Lillehammer, Norway, 9-11 April 2008.
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12Tejeddine Mouelhi and Franck Fleurey and Benoit Baudry and Yves Le Traon
A Model-based Framework for Security Policies Specifications, Deployment and Testing
Proceedings of the 11th International Conference on Model Driven Engineering Languages and Systems (MoDELS'08)Toulouse, France, 28 September - 1 October 2008.
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13Tejeddine Mouelhi and Franck Fleurey and Benoit Baudry
A Generic Metamodel For Security Policies Mutation
First International Conference on Software Testing Verification and Validation, {ICST} 2008, Lillehammer, Norway, April 9-11, 2008, Workshops Proceedings, 2008.
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14Tejeddine Mouelhi and Franck Fleurey and Benoit Baudry and Yves Le Traon
Mutating DAC And MAC Security Policies: A Generic Metamodel Based Approach
Proceedings of the 1st International Modeling Security WorkshopToulouse, France, 28th September 2008.
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15Yves Le Traon and Tejeddine Mouelhi and Benoit Baudry
Testing Security Policies: Going Beyond Functional Testing
The 18th IEEE International Symposium on Software ReliabilityTrollh\"attan, Sweden, 5-9 November 2007.
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16Tejeddine Mouelhi and Yves Le Traon and Benoit Baudry
Mutation Analysis for Security Tests Qualification
Proceedings of the 3rd Workshop on Mutation Analysis (MUTATION'07)Windsor, UK, 10-14 September 2007.
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17Benoit Baudry and Franck Fleurey and Yves Le Traon
Improving Test Suites for Efficient Fault Localization
Proceedings of the 28th International Conference on Software Engineering (ICSE'06)Shanghai, China, 20-28 May 2006.
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18Sagar Sen and Benoit Baudry
Mutation-based Model Synthesis in Model Driven Engineering
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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19Jean-Marie Mottu and Benoit Baudry and Yves Le Traon
Mutation Analysis Testing for Model Transformations
Proceedings of the 2nd European Conference on Model Driven Architecture - Foundations and ApplicationsBilbao, Spain, July 2006.
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20Yves Le Traon and Benoit Baudry and Jean-Marc J\'ez\'equel
Design by Contract to Improve Software Vigilance
IEEE Transactions of Software Engineering, 32(8), August 2006.
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21Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Automatic Test Case Optimization: A Bacteriologic Algorithm
IEEE Software, 22(2), March-April 2005.
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22Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
From Genetic to Bacteriological Algorithms for Mutation-based Testing
Software Testing, Verification and Reliability, 15(2), June 2005.
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23Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Automatic Test Case Optimization Using a Bacteriological Adaptation Model: Application to .NET Components
Proceedings of the 17th IEEE International Conference on Automated Software Engineering (ASE'02)Edinburgh, Scotland, 23-27 September 2002.
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24Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment
Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002.
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25Benoit Baudry and Vu Le Hanh and Jean-Marc J\'ez\'equel and Yves Le Traon
Trustable Components: Yet Another Mutation-Based Approach
Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)San Jose, California, 6-7 October 2001.
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